External Input: trajectory

Input	Value
Model name	sapre sapre_upload | trajectory
Model result name	trajectory
Quantity	trajectory

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External Input: trappedParticleSpectrum

Input	Value
Model name	ae8ap8 trapped-spectrum-ud trep_upload irene jorem-trapped | trep
Quantity	energy_flux_spectrum

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External Input: solarParticleSpectrum

Input	Value
Model name	creme-86-sep creme-96-sep sapphire-peak-flux sapphire-total-fluence sapphire-1-in-n-peak-flux sepflare_userdefined sapphire-total-fluence | sep-spectrum-ud
Quantity	energy_flux_spectrum

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External Input: gcrSpectrum

Input	Value
Model name	iso_15390 creme-86-gcr creme-96-gcr | nymmik-96-gcr
Quantity	energy_flux_spectrum

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Input group: let / multiplicity: one

Input	Description	Valid values	Default	Quantity
includeSEPSpectrum	Include solar particle spectrum.	0=No 1=Yes	1	number
includeTrappedSpectrum	Include trapped particle spectrum.	0=No 1=Yes	0	number
includeGCRSpectrum	Include GCR particle spectrum.	0=No 1=Yes	0	number
numberDevices	Number of devices.	min: 1 max: unbounded note: Integer > 0	1	number
outputResolution	Output resolution	0=Mission segment averages 1=Spectra for each orbital point	0	number

shield

Input	Description	Valid values	Default	Quantity
shieldThickness	Aluminium Shield thickness.	min: 0 max: unbounded note: Float > 0	1.0	number
shieldThicknessUnit	Shield thickness units	1=mils 2=g/cm2 3=cm	2	number

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Input group: device / multiplicity: many

Input	Description	Valid values	Default	Quantity
DMATERIAL	Device material		Si	number

device definition

Input	Description	Valid values	Default	Quantity
index	Unique device index. Incremental integer index of the device, 1, 2, 3 etc	min: 0 max: unbounded note: Integer > 0	1	number
deviceType	Device type		0	number
deviceMaterial	Device material	0=Si (SRIM2008) 1=Si (CREME-86) 2=GaAs (SRIM2008) 3=GaAs (GEANT4.9)	0	number
deviceName	Device name (when user defined device is selected)	note: text	DEFAULT	text
shapeSensitiveRegion	Sensitive region shape	0=Rectangular parallelpiped 1=Arbitrary	0	number
dimens	dimes		1	number
X	X		38.7	number
Y	Y		38.7	number
Z	Z		2.0	number
directIonisationMethod	Form assumed for the direct ionisation sensitivity cross-section	1=Critical charge -1=Wiebull function 0=Experimental data 2=Ignore	1	number
CCM	CCM		1	number
protonInducedMethod	Form assumed for the proton sensitivity cross-section.	1=Bendel function 2=Wiebull function 3=PROFIT 0=Experimental data 5=Ignore	1	number

direct ionisation

Input	Description	Valid values	Default	Quantity
criticalCharge	Critical charge Used when the direct ionisation cross-section method is set to 'Critical Charge' Used if directIonisationMethod==1		0.0113	number
letThreshold	LET threshold Used if directIonisationMethod==1		0.5485	number
letFlag	Algorithm for direct ionisation upset rates	0=Constant LET (CREME) 1=Variable LET 2=Slowing and stopping ions	0	number
weibull_s_direct	Weibull parameter, S Used if directIonisationMethod==-1		0.66	number
weibull_let_th_direct	Weibull parameter, LETth Used if directIonisationMethod==-1		0.55	weibull_let_th
weibull_w_direct	Weibull parameter, W Used if directIonisationMethod==-1		5.49	weibull_w
weibull_sigma_direct	Weibull parameter, sigma Used if directIonisationMethod==-1		1.5e-05	weibull_sigma

proton induced ionisation

Input	Description	Valid values	Default	Quantity
bendelParam1	Bendel parameter, A Used if protonInducedMethod==1		4.88	number
bendelParam2	Bendel parameter, B Used if protonInducedMethod==1		7.09	number
weibull_s_proton	Weibull parameter, S Used if protonInducedMethod==2		2.51	weibull_s
weibull_energy_th_proton	Weibull parameter, Eth Used if protonInducedMethod==2		4	weibull_energy_th
weibull_w_proton	Weibull parameter, W Used if protonInducedMethod==2		21	weibull_w
weibull_sigma_proton	Weibull parameter, sigma Used if protonInducedMethod==2		1.19e-10	weibull_sigma